ATView7006
The ATX7006 comes with ATView, a sophisticated software package for configuring, programming and controlling the ATX7006 and analyzing the results.
Example of ATView instrument panels
Setting up a test is just a matter of filling in the fields of the instrument panels, program a digital pattern if applicable, and press the START button. After a test the results are viewed in the WaveAnalyzer. The WaveAnalyzer can show the results of time domain, frequency domain and histogram tests. Zoom, stack, and cursor functions are available at any level.
Stacked linearity result of two different 16-bit DAC devices
When saving test results all settings are included. So when reviewing the results later, there never has to be any doubt about the exact conditions. Results and settings are stored in human readable XML format which allows easy user processing. Export in CVS format is possible and graphs can be saved in graphical format for easy importation into reports.
Dynamic result of a 14-bit/70Msps ADC
Test Methods:
All standard data converter test methods are supported. Dynamic parameters are measured with sine waves and the results can be analyzed in time domain as well as in frequency domain. Static parameters can be measured with direct ramp testing or with histogram testing. Histogram testing is supported for ramp, triangle and sine wave signals.
Example of a digital pattern, editable with the mouse or a script
ATCom7006
The ATX7006 is a command driven system that can easily be controlled from almost any programming environment.
Command level communication with the ATX7006 using ATCom (ID request and measure voltage at DRS channel1)
With ATCom commands can be sent and results read. This allows testing command sequences before implementing them in software.
For more information about the commands, please visit the Online Command Reference.